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Cadence Design Systems OrCAD Component Information Portal 元器件库
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Cadence Design Systems OrCAD Component Information Portal 元器件库

为了满足当今手机、数码相机、电脑、自动系统及其他电子产品市场对于功能多样化的需求,生产商将数十亿计的晶体管集中于一个芯片上。这一集成同时伴随着向更小工艺技术的转变,芯片上的晶体管及其他物理装置比用来打印他们的光波还小。没有电子设计自动化

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OrCAD DFM Checker的核心功能:

Hierarchical Rule-Set-Driven Analysis
The myriad of DFM checks and the overall analysis process can be easily managed by creating rules sets. Checks are organized into layer types and sub-categories to simplify the selection of checks to perform and the setting of corresponding parameters. De ne the type and order of a group of checks (rule set) to be performed. Analysis can include netlist or layer comparison, design rule veri cation, fabrication, and assembly checks on the entire design, a speci c layer. Analysis rule sets dramatically reduce set up and execution of the analysis and can be saved and recalled for use on any design. Rule sets can be de ned for a speci c PCB technology, vendor capability, or unique design requirement.

For many designs, different layers of a PCB have unique constraints and subsequently require custom analysis. Use unique rule hierarchy to tailor an analysis to bare-board construction, board density, or component technology.

PCB Fabrication Analysis
Fabrication analysis will detect speci c design content that may have an adverse effect on PCB fabrication. Features such as less-than-minimal spacing, acid traps, minimal annular rings, minimum features sizes, and copper and mask slivers are just
a few examples of the fabrication analysis available. Drill- related analysis includes minimal distances between drills, pads without drills, mill path errors, coincident or overlapping drills, and others.

PCB Assembly Analysis

Assembly analysis will detect speci c PCB content that may have an adverse effect on PCB assembly. Solder and paste mask features—such as less-than-minimal mask spacing, missing masks, extra mask, and minimal mask annular rings— are examples of mask analysis available. Silkscreen-related analysis includes ink over pads, ink over mask exposures, and other checks.

Error Charting
Large-scale analysis can often result in a large number of reported failures. Viewing the results of large-scale analysis in chart form allows you to get to the root of the failure and quickly ascertain a remedy. Charting allows you to review speci cs of the failures to identify trends or unexpected results. OrCAD DFM Checker’s charting feature (Figure 1) reports the exact nature of the error and the PCB features related to that error. The charting function groups common errors so they can be quickly identi ed and resolved.

Cross-Probing with OrCAD PCB Editor
OrCAD DFM Checker is tightly integrated with OrCAD PCB Editor, allowing designers to walk through errors. Selecting errors within OrCAD DFM Checker and zooming into the error location within OrCAD PCB Editor expedites the process of nding and correcting errors in the source PCB design.

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